Intended learning outcomes: Present the concept of the final assembly schedule (FAS). Describe how the MPS concerns the highest structure level still having a small number of different items. Identify FAS/MPS/OPP patterns in dependency on the product variety concept and their relation to the patterns of the T analysis.
Continuation from previous subsection (7.1.2)
A final assembly schedule (FAS) is a schedule of end items to finish the product for specific customers’ orders in a make-to-order or assemble-to-order environment. It is also referred to as the finishing schedule because it may involve operations other than the final assembly. Also, it may not involve assembly (e.g. final mixing, cutting, packaging). Cf. [ASCM22]. [note 701].
The type of FAS depends on the selection of items to be part of the master production schedule (MPS; see Section 5.2.3) and the production environment, as follows:
- Make-to-stock: The MPS comprises end products. In effect, the FAS is the same as the MPS.
- Assemble-to-order, or package-to-order: The MPS comprises (sub‑) assemblies. The FAS assembles the end product (a variant of a product family) according to customer order specification.
- Make-to-order: The MPS includes raw materials or components. The FAS fabricates the parts or subassemblies and assembles the end product according to customer order specifications.
In general, the MPS tends to concern the highest structure level still having a small number of different items. If this level corresponds to the (customer) order penetration point (OPP), only a minimum number of different items have to be stocked, and ideally — that is thanks to standardization — each item has a high degree of commonality. This corresponds to the concept of late customization (see Section 1.3.3) — a desired effect. Figure 7.1.2.2 shows this situation together with the corresponding FAS and MPS levels.
Fig. 7.1.2.2 The MPS concerns the highest structure level still having a small number of different items.
Figure 7.1.2.3 shows typical different patterns of MPS / FAS level and order penetration point in dependency on the product variety concept, or the four different classes of variant-oriented techniques: These patterns correspond to the different pattern of the T analysis within the VAT analysis.
Fig. 7.1.2.3 FAS / MPS / OPP patterns in dependency on the product variety concept and their relation to the patterns of the T analysis. The FAS level is at the right of each pattern.
In the case of products according to (changing) customer specification, an engineer-to-order production type may mean that no MPS can be established. The planning activities then address capacities (personnel hours) rather than parts or material (compare Figure 7.1.2.2).
Exercise: Product variety concepts.
Course section 7.1: Subsections and their intended learning outcomes
7.1 Logistics Characteristics of a Product Variety Concept
Intended learning outcomes: Differentiate between high-variety and low-variety manufacturing. Describe different variant-oriented techniques, and the final assembly schedule.
7.1.1 High-Variety Manufacturing
Intended learning outcomes: Identify values of characteristic features for high-variety manufacturing. Explain long- and medium-term planning for manufacturing according to customer specification or of product families with many variants.
7.1.1b Low-Variety Manufacturing
Intended learning outcomes: Disclose values of characteristic features for low-variety manufacturing.
7.1.2 Different Variant-Oriented Techniques
Intended learning outcomes: Differentiate between adaptive and generative variant-oriented techniques. Disclose typical sets of characteristics and production types that arise frequently with the four product variety concepts.
7.1.2b The Final Assembly Schedule (FAS)
Intended learning outcomes: Present the concept of the final assembly schedule (FAS). Describe how the MPS concerns the highest structure level still having a small number of different items. Identify FAS/MPS/OPP patterns in dependency on the product variety concept and their relation to the patterns of the T analysis.
